How to conduct semiconductor aging testing?
Performing aging tests to replicate the actual on-site stress environment can help reduce failure rates. Aging testing is crucial for ensuring quality control of the production line.
High and low temperature and low pressure test chamber
High and low temperature and low pressure test chamber is a device that simulates high altitude, high-altitude, and (high-altitude) climates for storage, transportation, and reliability testing. It can also test the electrical performance parameters of the test piece by simultaneously powering it on.
Application
Suitable for conducting high and low temperature, altitude (not higher than 30000 meters or 45000 meters above sea level), as well as high and low temperature cycling tests, temperature and height comprehensive tests on defense industry, aerospace industry automation components, automotive components, batteries, flat screen module industry and related product materials. During high and low temperature tests, this test chamber can be used for testing heat dissipation test samples and non heat dissipation test samples.
Specifications
| model | 100L | 150L | 225L | 408L | 800L | 1000L | |
| W*H*D (mm） |
within | 400×500 x500 | 500×600×500 | 500×750×600 | 600x850×800 | 1000×1000x800 | 1000×1000×1000 |
| outside | The size of the outer box can be customized according to customer requirements, and the inner box can also be customized as needed | ||||||
| Temperature Range | low temperature -70℃、-60℃、-40℃、-20℃.0℃、ordinary temperature；high temperature +150℃、+100℃、+80℃ | ||||||
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