PXI - Open industrial standard for modular test instruments and switch platforms based on PCI/PCIe.

Receiver - mass interconnection panel, which can provide connection interface between the equipment under test and the test instrument.

Signal routing system - all signals on the path between the equipment under test and the test instrument, including switch components and any external connectors and cables.

When the product is tested on the workbench, the test environment is usually the best, and there is a short, direct cable connection between the product and the excitation and measurement equipment. However, when testing in the production process, there may be a very complex connection network between the equipment under test (DUT) and the test instrument, including cables, signal distribution devices, signal switch subsystems, connector adapter panels and adapters for specific equipment. All of these devices can not improve the quality of the original signal that directly travels between the instrument on the workbench and the product during product development, but may cause the signal quality to decline. Basically, all cables, interfaces and switches should be considered as the extension of the test instrument, and must be taken into account when evaluating the performance of the instrument.

When developing new products, it is often necessary to manually operate on the experimental workbench to verify the product design. Once the verification of product design is completed, the task of meeting the product specification and performance requirements will be transferred to the production test engineering team. Ideally, all requirements for testing have been considered at the beginning of the product design, but in fact, product testing can only be carried out after the product design is completed, so problems are often exposed gradually in the later stage. The test engineering team will create a test process for the product, which is a part of the product manufacturing process, and the test process needs to be efficient enough to support the requirements of product manufacturing. This process is usually automated to speed up testing and reduce man-made errors due to the involvement of test technicians. The software code running on the computer controls the test instruments on the rack. These instruments provide excitation for the equipment under test and measure the feedback from the equipment under test. It is not easy to create an automatic test platform. Testing is often made more difficult because the test platform is required to have enough functions to support different types of products. For different products, the input and output signals of the system will be routed to the equipment under test through the adapter, so it is inevitable to introduce some signal connection points, which may damage the integrity of the test signal.

Chengdu Chinacryo Technology provides the IC chip temperature impact tester TS-780 with high quality and cost-effective, which can accurately and quickly realize the high and low temperature cycle test, thermal stock test, aging test, reliability test, etc. of electronic components such as electronic chips. The temperature conversion of TS-780 is from - 55 ℃ to+125 ℃ for about 10 seconds, and has a wider temperature range of - 80 ℃ to+225 ℃; Through long-term multi working condition verification, it meets the requirements of more production environment and engineering environment.