The accelerated aging test for optoelectronic devices and modules is a crucial method to evaluate their long-term reliability and lifespan by simulating extreme environmental conditions to induce potential defects in a short period of time. Generally speaking, genuine reliability testing focuses on physical failures, which occur under three or more stress levels (for example, at three or more temperatures), typically stronger than the stress conditions used for device verification, and employs a smaller sample size.
Accelerated aging testing is based on the theory of environmental stress accelerated aging. By constructing combinations of environmental parameters (such as high temperature, high humidity, temperature cycling, etc.) that exceed conventional usage conditions, it promotes the early manifestation of potential issues within optoelectronic devices and modules. Accelerated aging testing serves as the starting point for a genuine reliability test.
Main items and scope of application of accelerated aging test:
| test project | test conditions | sample size | Scope of Application |
| high temperature | 70℃，10000 hours | 10 | Laser diodes (maximum rated power or current), LEDs (maximum rated current), and EA modulators (under appropriate conditions) |
| high temperature | 85℃，10000 hours | 10 | Laser diodes (maximum rated power or current), LEDs (maximum rated current), and EA modulators (under appropriate conditions) |
| high temperature | 175℃，5000 hours | 10 | Photodiode (2×VOP) |
| high temperature | 70℃， 5000 hours | 5 | All optoelectronic and integrated modules used in CO environments (maximum rated power and current for laser and LED modules, normal operating conditions for receiver modules, appropriate conditions, including maximum specified modulation rate for external modulators) |
| high temperature | 85℃，5000 hours | 5 | All optoelectronic and integrated modules used in UNC environments (maximum rated power and current for laser and LED modules, normal bias voltage for detector modules, normal operating conditions for receiver modules, including maximum specified modulation rate for external modulators) |
| temperature cycling | －40／+85℃，500 cycles | 5 | All optoelectronic modules and integrated modules used in CO environment |
| temperature cycling | －40／+85℃，1000cycles | 5 | All optoelectronic modules and integrated modules for UNC environments |
| damp-heat | 85℃／85%RH， 5000 hours |
5 | All photodiodes designated for non-hermetic modules [laser diodes: 1.2× ITH, LEDs: 0.1× IOP (max), photodiodes: normal bias voltage, EA modulators: appropriate conditions], as well as all non-hermetic optoelectronic modules [laser modules: 1.2× ITH, LED modules: 0.1× IOP (max), detector modules: normal bias voltage, external modulators: appropriate conditions, receiver modules: normal operating conditions] |
| damp-heat | Maximum operating temperature(85℃)／85%RH, 5000 hours | 5 | All optoelectronic integrated modules (under normal operating conditions) |
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