Chip aging test is a method of conducting long-term operation and load testing on chips to simulate the aging situation of chips in actual use. The purpose of chip aging test is to evaluate the reliability and performance stability of chips under long-term use and load conditions, in order to determine their lifespan and reliability indicators.
Design of chip aging testing plan:
-Select appropriate test load: Determine the appropriate test load based on the application scenario and expected usage conditions of the chip, including parameters such as voltage, frequency, temperature, etc.
-Design testing duration: Determine the testing duration based on the expected lifespan and application scenarios of the chip, typically ranging from several hours to several thousand hours.
-Determine the testing environment: Determine the testing environment, including temperature, humidity, and other environmental conditions, to simulate the actual usage environment.
-Develop testing plan: Based on testing requirements and time constraints, develop a detailed testing plan, including testing start time, duration, testing parameters, etc.
Chip aging testing process:
-Set up testing equipment: According to the testing plan, set up testing equipment, including power supply, temperature control equipment, etc.
-Run test program: According to the test plan, run the test program to perform long-term operation and load testing on the chip.
-Monitoring and recording data: During the testing process, continuously monitor and record the operating status and performance parameters of the chip, such as temperature, current, power consumption, etc.
-Regular inspection and maintenance: Regularly inspect testing equipment and chips to ensure the stability and accuracy of the testing process.

The Zonglen HAST aging test chamber is mainly used to evaluate the reliability of products or materials in humid environments. It is achieved by setting and creating various conditions of temperature, humidity, and pressure in a highly controlled pressure vessel, which accelerates the penetration of moisture through the external protective plastic packaging and applies these stress conditions to the material body or the interior of the product. HAST increases the pressure inside the container, enabling temperature and humidity control under conditions exceeding 100 ℃, accelerating the aging effects of temperature and humidity (such as migration, corrosion, insulation degradation, material aging, etc.), greatly shortening the testing cycle of reliability assessment, and saving time and cost.

Steps for using the HAST aging test chamber:
1. Set test parameters: Based on the chip specifications and testing requirements, set appropriate parameters such as test duration, voltage, frequency, temperature, etc. 2. Start testing: Click the "Start" button to initiate the chip aging test. We will begin monitoring and recording the operational status and performance parameters of the chip.
3. Monitoring and recording data: During the testing process, the operating status and performance parameters of the chip will be continuously monitored, such as temperature, current, power consumption, etc. These data will be recorded for subsequent analysis and reporting.
4. End the test: Stop the test when the test time reaches or reaches the preset conditions.
The specific design and implementation of chip aging tests should be adjusted and expanded according to the type of chip, application scenarios, and testing requirements. In addition, to ensure the accuracy and reliability of the test results, the aging test equipment should comply with relevant testing standards.